TSI Moves to Protect Workers From Potential Nanoparticle Exposure
TSI Moves to Protect Workers From Potential Nanoparticle Exposure

TSIs NanoScan SMPS Nanoparticle Sizer Measures Airborne Nanoparticle Size Distribution and Concentration

Online PR News – 29-February-2012 – Shoreview, Minn. - The new NanoScan SMPS Nanoparticle Sizer from TSI Incorporated is a small, portable instrument developed to provide an affordable method to measure the size distribution of nanoparticle emissions in the workplace and in research settings allowing companies to determine whether they have a potential problem withnanoparticle exposure in their workplace.

Nanotechnology is an active area of scientific research due to the wide variety of commercial applications. However, nanoparticle emissions, generated from a wide variety of common sources, are considered a potential indoor/outdoor air quality hazard. Small, lightweight, and battery powered, the NanoScan SMPS provides real-time particle size measurement and concentration data. Information on the size distribution of airborne nanoparticles can help differentiate between nanoparticles from emission sources and background airborne particulates.

The NanoScan SMPS offers investigators interested in worker exposure an option that was not previously available: affordable nanoparticle size measurement, said Kathy Erickson, an application specialist at TSI. Size information gives them one more piece to the puzzlehelping to differentiate between potentially harmful engineered nanoparticle emissions and naturally occurring ultrafine particles.

The NanoScan SMPS is particularly useful for applications that require portability. Occupational hygiene applications such as work place surveys and point source identification, or research applications like on-road emission measurements and field studies, will benefit from the instruments compact design and ease of use. The lower cost of the NanoScan SMPS versus comparable instruments also opens up the possibility of simultaneous temporal and spatial measurements with multiple units.

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Danielle Ziemer
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